Doing More with Less – An IEEE 1149.7 Embedded Tutorial : Standard for Reduced-pin and Enhanced-functionality Test Access Port andBoundary-Scan ArchitectureAdam W LeyASSET InterTech, Inc. Richa
基础篇When I was in Grade Seven, I volunteered at a hospital. I usually stayed with Mr. Gillespie-a patient in a coma(昏迷).He never had any visitors, and 1 emed to care about him. As a volunteer, I spen