rvant专利名称：wafer map data verification system 发明人：保坂 英希
申请号：JP2014507168
申请日：20120329
consciousness
公开号：JP5761771B2
吸血鬼日记3公开日：
meridianvampires>closure20150812
专利内容由知识产权出版社提供
摘要： wafer map data image, array images of the same die as the wafer image captured by the camera in, ctions of each die parated by grid lines are displayed at the same size as each die of the wafer image. Operator mice, by operating the input device or a touch panel such as a keyboard, on a screen of the display device, and the display position of the wafer image or wafer map data images to move the superposition of the wafer image and the wafer map data image By match, by comparing the wafer image and the wafer map data image, to specify the adsorption start die. Then, start the production, according to the wafer map data, only the good die from the suction start die is picked up in order to be mounted on the substrate. .BACKGROUND 1申请人：富士機械製造株式会社
地址：愛知県知立市山町茶碓山１９番地
出差计划国籍：JP考研最容易调剂的大学
i still believe 歌词代理人：加古 宗男
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