TEG TEST KEY OF ARRAY SUBSTRATE AND DISPLAY PANEL

更新时间:2023-07-07 06:02:35 阅读: 评论:0

direct是什么>小不点学英语专利名称:TEG TEST KEY OF ARRAY SUBSTRATE AND
DISPLAY PANEL
muscles发明人:Gang TAN
申请号:US16765430
申请日:20200421
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公开号:US20220115279A1有道翻译手机下载
wagas公开日:
20220414
专利内容由知识产权出版社提供
专利附图:
深圳英孚英语培训摘要:A test element group (TEG) test key of an array substrate and a display panel thereof are provided. The TEG test key of the array substrate includes a glass substrate,a multi-buffer layer, an active layer, a gate insulating layer, a gate electrode layer, an
中大自考
interlayer insulating layer, a source and drain electrode layer, and an organic planarization layer stacked in quence. The TEG test key of the array substrate is defined with two test zones and a connecting zone, and each test zone is provided with a groove exposing the gate electrode layer. The gate electrode layer in the test zones is electrically connected to the source and drain electrode layer in the connecting zone.
申请人:WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.读研出国
地址:Wuhan, Hubei CNcharge
国籍:CN
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