globalization作文专利名称：Stacked via Kelvin resistance test structure
for measuring contact anomalies in multi-
sine
level metal integrated circuit technologies
发明人：Robert Alan Ashton,Steven Alan Lytle,Mary
Drummond Roby,Daniel Joph Vitkavage
申请号：US09388203
申请日：19990901
公开号：US06362638B1佳能广告曲
公开日：
读万卷书不如行万里路英文>初二下册英语语法
icbc 爱存不存20020326
专利内容由知识产权出版社提供
专利附图：
摘要：A method and apparatus for measuring Kelvin contact resistance within an
ville
integrated circuit interconnect is provided, having upper and lower Kelvin contact resistance contacts covering a via and interconnect being measured, along with a third conductor placed substantially between the upper and lower Kelvin contacts, and in contact with the via.
鹤立鸡群是什么意思
播音主持培训课程申请人：AGERE SYSTEMS GUARDIAN CORP.
代理机构：Alston & Bird LLP
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