onair专利名称:Alignment system and method for infrared interferometer量词有哪些
发明人:Steven R. Lange
申请号:US07/545404
申请日:19900628
公开号:US05055695A
公开日:general
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gluck>submissive
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专利内容由知识产权出版社提供
摘要:A system for aligning a test beam of an infrared interferometer with a reference beam thereof includes a phosphor screen positioned in a common path of the interferometer at a focal point of a lens in the path. The phosphor screen is illuminated with ultraviolet light to stimulate an area of the phosphor screen to emit visible light. Infrared lar light from the test beam is focud onto a spot of the phosphor screen. The infrared lar light acts on the spot to prevent the phosphor screen from emitting visible light from the spot and hence the position where the lar beam strikes the phosphor screen appears dark. Visible light emitted by the phosphor screen is focud into a visible light camera, and an image of visible light emitted by the phosphor screen is produced on a video monitor. The dark spot on the phosphor screen appears as an image spot on the video monitor. The test beam is adjusted to move the image spot to a predetermined location of the video monitor reprenting an aligned condition. In the described embodiment, infrared light in the reference arm of the interferometer is blocked to prevent it from being focud onto the phosphor screen. After alignment of the test beam, the phosphor screen is removed from the path to allow an interference beam produced by interference between the reference beam and the test beam to be
日语在线翻译网站imaged into an infrared camera.
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美国大学排名2019申请人:WYKO CORPORATION
代理机构:Cahill, Sutton & Thomas 更多信息请下载全文后查看