ANA-First/Third Order Analysis The First/Third Order Analysis (ANA) option computes simple diagnostic analys of the optical system including: first-order traces and third-order aberrations, pattern ray traces and wave aberrations, and higher-order ray aberration analys.When to U the First/Third Order Analysis Option The First/Third Order Analysis (ANA) option provides veral simple diagnostic analysis computations that
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can be uful in understanding the detailed aberration properties of an optical system. This option reprents a logical next step beyond the very simple results of such options as List First Order Data (五年级上册英语试卷
Display >List Lens Data >First Order Data menu, or FIR option), Real Ray Trace (Analysis >Diagnostics >Real Ray Trace menu, or SIN option), and Paraxial Ray Trace (Analysis >Diagnostics >Paraxial Ray Trace menu, or FIO option).
First/Third Order Analysis includes multi-wavelength third-order aberrations and their differences; the can help you to analyze chromatic variations of aberrations. It also includes pattern ray tracing (fans) for more comprehensive ray analysis, and higher-order analysis of ray aberrations.
First/Third Order Analysis Default Operation
Listed output is provided for each zoom position for:
•First-order traces with third-order transver aberrations listed at each surface plus image distance,
effective focal length (EFL) and aberration sums, for the reference wavelength
•Image distance, EFL, and third-order sums for each of the other wavelengths and their difference from
the reference wavelength
•Tracing of a standard pattern of ray fans at each field, listing image surface ray aberrations and wave
aberration (OPD) for each ray, relative to the chief ray. Distortion, entrance and exit angles, and field focus values are given for the chief ray at each field. Rays are traced at each wavelength.
The, and other operations, can be individually lected by command; when such lections are made, the default group is abandoned and only tho operations lected will be performed.
Command Mnemonics
(alphabetical)DEL HIG RAY SSP
THI
ANA - First/Third Order Analysis
Defining First/Third Order Analysis Mode/Output Controls
Defining First/Third Order Analysis Mode/Output Controls To modify default output and other ttings for First/Third Order Analysis, choo the Analysis >Diagnostics >First/Third Order Analysis menu. The First/Third Order Analysis dialog box displays with the Mode/Output tab lected. Define the mode/output controls as described in the table that follows.Command Syntax Screen Control Explanation
Default THI [ F
| P | N ]....w,z]
Third-order analysis
Specifies first-order traces and third-order analysis.Wavelength Specifies the wavelength included in the output.Zoom
Specifies the zoom position included in the output.Third Order Analysis Designates the information listed for each wavelength/zoom position:
All Surfaces (F) - lists all surfaces and sums. Is the
default tting for the reference wavelength.Focal Plane (P) - lists only sums. Is the default tting for all wavelengths except the reference wavelength.
No List (N) - no listing.
More than one THI command can be given to complete the lection.
Third-order analysis (THI)
is performed for all
wavelengths/zoom positions, with All
Surfaces (F) listed in the
reference wavelength, and
Focal Plane (P) values in
other wavelengths.
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ANA - First/Third Order Analysis Defining First/Third Order Analysis Mode/Output Controls RAY [ Yes
| No....w,z ]Trace ray pattern Traces rays in pupil pattern according to value
注册会计师考哪几门课程specified in Real Ray Interval (pupil frac.) field (DEL command), producing fans in +Y,-Y,+X (and -X if no Y-plane symmetry exists). Only focal plane values are given; u
Surface Print tab (SSP command) to obtain a more extensive listing. U Trace ray pattern
spreadsheet to turn on/off individual wavelengths/zoom positions:Wavelength
Specifies wavelength included in output.
condly
Zoom Specifies zoom position included in output.
More than one RAY command can be given to complete the lection.
Trace ray pattern (RAY) is included by default only if no commands are given.DEL ray_interval_
Real ray interval (pupil frac.) Specifies interval between rays in pattern ray tracing (RAY, HIG, SSP commands), in fraction of pupil radius. Rays are traced at relative fractions of the vignetted pupil radii of:1.0, 1.0-DEL, 1.0-2 * DEL, ...
until 1.0-n * DEL < or = DEL.
Range: 0.01 < value < 1.01; 1.01 eliminates all but
chief rays.
0.2000001, giving rays at 1.0, 0.8, 0.6, 0.4 * vignetting in each fan of the pattern.
HIG Yes | No
Higher-order a nalysis Selects higher-order analysis of pattern rays (in reference wavelength only), listing the ray equivalents
for third-order aberration contributions and for fifth plus higher-order aberration contributions for each ray as computed from the Aldis theorem; listed also is the史籍
ratio of total ray aberration contribution to third-order. The contributions for the chief ray and extreme two rays of each fan are listed surface-by-surface at each
field; the contributions of the chief ray are removed from all other rays at that field.
No. Not done.Command Syntax Screen Control Explanation Default
ANA - First/Third Order Analysis
Listing Surface-by-Surface Ray Coordinates
gtr是什么意思Listing Surface-by-Surface Ray Coordinates With the First/Third Order Analysis option, you can also obtain listings of surface-by-surface ray coordinates for lected (or all) rays. To do this, choo the Analysis >Diagnostics >First/Third Order Analysis menu. When the First/Third Order Analysis dialog box displays, click the Surface Print tab. Define the surface print controls as described in the table that follows.Command Syntax Screen Control
Explanation Default SSP [ P
| F | N....f,z ]
Reference wavelength trace Selects pattern ray tracing (in reference wavelength only), listing surface-by-surface coordinates.
Single Surface Selects surfaces included in output. Select
All Surfaces
(F) for a surface-by-surface listing for all rays, Focal Plane
for a surface-by-surface listing for chief and extreme rays only, or No List for No Listing.
Field Specifies field included in output.
Zoom
Specifies zoom position included in output.
More than one SSP command can be given to complete the lection.
Not done.
ANA - First/Third Order Analysis Discussion of Input and Computations Discussion of Input and Com
putations What to Include in LDM Lens Data Any valid lens system can be analyzed by this option; no additional LDM data is necessary. Note, however, the limited applicability of Third-order analysis (THI) and Higher-order analysis (HIG ) data for non-centered systems and for systems with special surfaces (e Functions of the ANA Option for details).Functions of the ANA Option Default operation of the ANA option is the combination of THI plus RAY with default DEL , excluding HIG and SSP .Third-order Analysis
Third-order analysis (THI ) is bad on classical aberration theory, in which image defects are expresd as polynomial expansions in object and pupil coordinates (e Born & Wolf, Principles of Optics (5th ed.), Pergamon Press, pp. 211-218 for a derivation of the power ries expansion). Such a polynomial expansion can be carried to any order (third, fifth, venth, etc.), but the third-order (or Seidel) aberrations are the most widely ud. Surface contributions can aid in understanding the sources as well as the forms of aberration prent in a lens design (e W. Smith, Modern Optical Engineering , McGraw-Hill, pp. 49-57 for good explanations of the Seidel aberrations). Becau third-order data are calculated in multiple wavelengths (if prent), they can al
so aid in the analysis of the chromatic variation of aberrations; surface-by-surface output for each wavelength is controllable by ttings in the First/Third Order Analysis dialog box on the Mode/Output tab, or with the THI command.
Third-order aberrations are calculated from paraxial data (e Technical Notes). Becau of this, third-order aberrations are strictly valid only for centered systems.武汉新东方英语学校
restfulAlthough third-order aberrations will be calculated for any system in CODE V, you should be aware of specific limitations that can limit the accuracy of the calculations. Third-order computations are done correctly for centered systems consisting of plane, spherical, and polynomial aspherics. Third-order computations for cylindrical surfaces are done for the equivalent spherical-surface in the meridian designated by XZF (in LDM). Third-order computations for aspheric toroids are for the equivalent aspheric. For
gradient index and diffraction grating surfaces, they are for the aspheric without regard to the index variation or diffraction. Splines generate aberrations of all orders (2,) and are only treated as a parabola of equivalent power. No effect of decentration is included; therefore, for decentered systems, third-order computations may or may not be of value, depending on system structure.
Ray Fans
Ray fans (obtained with the Trace ray pattern controls in the First/Third Order Analysis dialog box on the Mode/Output tab, or with the RAY command) are bad on real rays and can be uful in understanding the overall aberration properties of an optical system (e W. Smith, pp. 68-71 for a discussion of ray trace curves). Ray fans display data for the image surface only (no surface contribution or ray coordinate information). U Trace ray pattern or RAY when you want transver ray aberrations, OPD, and chief ray properties in tabular form. The Real ray interval control or DEL command controls the spacing and number of rays in the pattern. Note that the Ray Aberration Curves (RIM) option provides similar information in graphical form — plotted ray fans (transver aberrations or OPD). RIM is usually more convenient for studying aberration forms or for comparing the correction of veral optical systems.
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U the Reference wavelength trace control on the Surface Print tab or the SSP command when you want tabular information similar to Trace ray pattern , but with the addition of surface-by-surface ray coordinates for lected (or all) rays. This can produce a large volume of output that would typically be directed to a file for printing and review. For interactive u, tracing individual rays may be more convenient (RSI or SIN commands in the LDM). As with Trace ray pattern , Real ray interva
l controls the spacing and hence the
number of rays in the pattern.
