长沙托福报名专利名称：EMISSIVITY METER
合肥电脑培训发明人：ARAKAWA YOSHIAKI,FUKUNAGA HIROSHI 申请号：JP12369282
新概念英语第一册全集申请日：19820715中国翻译网
公开号：JPS5913927A
cezanne>镀铬英文
公开日：
stormydaniels19840124
专利内容由知识产权出版社提供
摘要：PURPOSE:To obtain emissivity without influences of temperature on a surface of a material to be measured and a surface of an emissivity plate of an emissivity meter, by providing three emissivity plates or more having different emissivities on the same plane and obtaining the density of a flowing heat current. CONSTITUTION:Three emissivity plates 2a-2c having known emissivities and different values respectively are provided cloly to each other on the same plane, and heat current meters 5a-5c are provided respectively at the rever sides. The emissivity of a material surface 1 to be measured is denoted by epsilonx, the respective emissivities of the plates 2a-2c as epsilon1-epsilon3 and the heat current densities passing respectively through the plates 2a-2c as psi1-重庆造价师培训
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psi3,respectively. It is found from an equation that DELTApsi13/DELTApsi23 is a function of epsilonx, and if outputs of psi1-psi3 of the meters 5a-5c are found, the emissivity epsilonx of the surface 1 can be obtained independently of the surface temp. Ts of the material to be measured and the surface temp. Tp of the emissivity plate.
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申请人：SHOWA DENKO KK
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