专利名称：X-RAY EXAMINATION APPARATUS
COMPRISING AN EXPOSURE-CONTROL
SYSTEM
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malarkey发明人：DILLEN, Bartholomeus, Goverdina, Maria, Henricus,SNOEREN, Rudolph, Maria
申请号：IB1996001037
申请日：19961002
公开号：WO97/014277P1
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公开日：董事长助理 英文
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19970417
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摘要：An X-ray examination apparatus (1) compris an X-ray source (2) and an X-ray image intensifier (5) for deriving an optical image from an X-ray image, which optical image is picked up by means of an image pick-up apparatus (6). The X-ray examination apparatus also compris an exposure-control system (7) for adjusting the X-ray source and/or the image pick-up apparatus on the basis of brightness values of a region of interest in the optical image. The exposure-control system compris a photodetector, for example a CCD nsor, for deriving a photodetector signal from the optical image and a photonsor for adjusting the nsitivity of the photodetector. The photodetector (9) compris an image pick-up ction (11), an image memory (13) comprising parate ctions, preferably including an intermediate memory (15). An electronic image in the image pick-up ction is quickly transferred to an available storage ction after which it is read out as an electronic image signal. For example, the electronic image is first transferred to the intermediate memory wherefrom it is quickly transferred to the image memory after which it is read out as an electonic image signal.
申请人：PHILIPS ELECTRONICS N.V.,PHILIPS NORDEN AB 地址：NL,SE
人认为国籍：NL,SE
安全度
代理机构：SCHOUTEN, Marcus, M.
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