Outgoing Defect Specification
MT9V113
Introduction
uacinemaThis document defines outgoing defect specifications (preliminary) for the Aptina
MT9V113 image nsor. The nsor defect regions, as well as types of pixel and cluster
defects, are defined.
Sensor Defects
The nsor array is partitioned into two regions: Region I and Region II. The dimen-
sions are defined in Figure 1.
Figure 1: Sensor Array
Defect Specifications
Table 1 and Table 2 specify the maximum number of defects for each of the regions defined in Figure 1 on page 1.哈尔滨新东方官网
Note:
Image nsor is tested without a lens. Multiple images captured and analyzed in Bayer format. Setup: V AA =VAA_PIX =V DD _PLL = 2.8V, V DD = V DD _IO = 1.8V.
Note:
Image nsor is tested without a lens. Multiple images captured and analyzed in YCbCr format. Setup: V AA =VAA_PIX =V DD _PLL = 2.8V, V DD = V DD _IO = 1.8V.
Conditions for Image Test Aspud
•Full resolution images (four frames) are captured at 15 fps in SOC bypass mode (raw Bayer format) in dark condition with no defect correction and without a lens system. Frames are averaged for analysis.
•Sensor analog gain is 8x for all color planes and digital gain is 1x (unity).
•The nsor is operated at maximum external clock frequency with PLL enabled.
Conditions for Image Test B
•Full resolution images (four frames) are captured at 30 fps in SOC bypass mode (raw Bayer format) with light condition equivalent to get 50 percent of nsor full-scale output, without a lens system. Frames are averaged for analysis.
•Sensor analog gain is 1x for all color planes and digital gain is 1x (unity).
•The nsor is operated at maximum external clock frequency with PLL enabled.
Table 1:
Defect Specification with Defect Correction Disabled (Bayer Format)
Operating condition: T J = 55°C
Defect Definition
Number of Defects
Definition Number Region I
原来如此日文Region II
Very hot, very bright, or very dark pixel defects Total ≤ 20Total ≤ 65Total ≤ 10
1, 3, 5Hot or bright pixel defects 2, 4Dark pixel defects 6Bright clusters 07Dark clusters 0
8
Table 2: Defect Specification with Defect Correction Enabled (YCbCr Format)
Operating condition: T J = 55°C
Defect Definition Number of Defects
Definition Number Region I
Region II
Bright pixel defects 09, 14Dark pixel defects 010, 15Bright clusters 011Dark clusters
012Row or column defects 0
13
Conditions for Image Test C
•Full resolution images (four frames) are captured at 5 fps in SOC YCbCr mode with 1.5
lux incident light with defect correction enabled and without a lens system. Frames
are averaged for analysis.
•Sensor analog gain is 16x for blue color plane and all digital gain is 1x (unity). ADC
elyesreference and gamma are t to default conditions.
•The nsor is operated at maximum external clock frequency with PLL enabled. Conditions for Image Test D
•Full resolution images (4 frames) are captured at 7.5 fps in SOC YCbCr mode with 1.5
lux incident light, without a lens system. Frames are averaged for analysis.
•Sensor analog gain is 8X for blue color plane and all digital gains are unity. ADC refer-
大数定理ence and gamma are t to default conditions.
•The nsor is operated at maximum external clock frequency with PLL enabled.
Cluster Defects
Figure2 and Figure3 reprent the same sub-area of pixels. Figure2 reprents the raw
Bayer pixel output form. Figure3 reprents the pixel output parated by color plane.
Clusters are analyzed by looking at one particular pixel and its surrounding eight adja-
cent pixels within the same color plane, as en in Figure3. For example, if the center
pixel is a dark pixel and any of its surrounding eight pixels within the same color plane
are dark pixels then it is defined as a dark cluster.
Figure 2: Raw Pixel Data
Figure 3: Pixel Output Separated by Color Plane
Defect Definitions in SOC Bypass Mode
Defect definitions in the bypass mode (with no defect correction) are defined in this
ction.arenas
Definition 1: Very Hot Pixel Defect
A very hot pixel defect is defined as any single pixel that is greater than 50 percent of the
nsor full-scale output when the nsor is operated as in image test A.
Definition 2: Hot Pixel Defect
A hot pixel is defined as any single pixel that is greater than 15 percent of the nsor full-
scale output when the nsor is operated as in image test A.
Definition 3: Very Bright Pixel Defect
Within a color plane, each pixel is compared to the mean of the neighboring 11 x 11
pixels. If the pixel value is 50 percent or more above the mean, it is considered a very
bright pixel defect when the nsor is operated as in image test B.
可汗学院公开课Definition 4: Bright Pixel Defect
Within a color plane, each pixel is compared to the mean of the neighboring 11 x 11
pixels. If the pixel value is 15 percent or more above the mean, it is considered a bright
pixel defect when the nsor is operated as in image test B.
Definition 5: Very Dark Pixel Defect
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Within a color plane, each pixel is compared to the mean of the neighboring 11 x 11
pixels. If the pixel value is 50 percent or more below the mean, it is considered a very
dark pixel defect when the nsor is operated as in image test B.
Definition 6: Dark Pixel Defect
Within a color plane, each pixel is compared to the mean of the neighboring 11 x 11
pixels. If the pixel value is 15 percent or more below the mean, it is considered a dark
pixel defect when the nsor is operated as in image test B.
Definition 7: Bright Cluster
sisterUsing definition 4 results, the defects within each color plane are examined. If any two or
more adjacent pixels that are considered bright pixel defects are detected, they are then
defined as a bright cluster.
Definition 8: Dark Cluster
Using definition 6 results, the defects within a color plane are examined. If any two or
more adjacent pixels that are considered dark pixel defects are detected, they are then
defined as a dark cluster.
