•Electron source -gun •Electron column
-lens
-apertures
-deflection coils •Specimen chamber with detectors
怎样写好字NFMC Spring School on Electron Microscopy, April 2011
W-hairpin
E =105A/cm 2sr d s = 30-100 P m
LaB 6
简单好看的手工E =106A/cm 2sr d s = 5-50 P m
Field emission -Cold -Thermal -Schottky
SEM: Electron Lens
Electromagnetic lens defects:
Spherical aberration: d s =1/2C s D 3Chromatic aberration: E/E 0)
丁红玉
1/f=1/p+1/q Magnification =M=q/p Demagnification=m=p/q
除夕祝福
The working distance is defined as the distance between the lower pole piece of the objective lens and the plane at which the probe is focud.
Working distance
Pole piece
detector
Sample at ideal working
distance for X-ray
microanalysis
Sample at incorrect working distance for X-ray microanalysis
Effect of aperture size Effect of condenr lens strength
Effect of working distance
=(d
G
2+d
S
2+d
d
2+d
C
曹操脸谱
钵钵鸡2)1/2 min
= KC
s
1/4l3/4(i
游泳镜
p
/EO2+1)
SEM: Interaction Volume
跌停是什么意思Penetration depth: 1-5 P
