专利名称：INTEGRATED CIRCUIT SPIKE CHECK
中文英文狡黠的近义词APPARATUS AND METHOD
磁盘存储
发明人：Robert Gabriel Almendarez
申请号：US16814357
申请日：20200310
公开号：US20210286003A1
公开日：
一支春
20210916
财货专利内容由知识产权出版社提供
专利附图：
摘要：Apparatus for testing an integrated circuit is described, including a t of signal conductors for communicating signals to respective external conductors of the
王字旁加深的右边integrated circuit. The apparatus also includes a tester comprising circuitry for outputting
a signal. An interpor is electrically coupled between the t of signal conductors and the tester. The interpor compris circuitry for lecting a t of signals between the t of signal conductors and the tester and outputting the t of signals. A signal processing apparatus is coupled to receive the t of signals, and the signal processing apparatus is operable to evaluate a parameter associated with each signal in the t of signals.
申请人：Texas Instruments Incorporatedtaste是什么意思
地址：Dallas TX US
山东电信dns
国籍：US
更多信息请下载全文后查看
