生活好难
New constraints on electron-beam induced halogen
migration in apatite
期刊名称： American Mineralogist
作者： Stock, M. J.,Humphreys, M. C. S.,Smith, V. C.,Johnson, R. D.,Pyle, D. M.
年份： 2014年
期号： 第1期
关键词： Apatite; electron-probe microanalysis; condary ion mass
spectrometry; halogen migration; beam damage
摘要：Fluorine and chlorine Xray count rates are known to vary significantly during electron probe microanalysis (EPMA) of apatite. Since the rate, timing, and magnitude of this variation are a function of apatite orientation and composition, as well as EPMA operating conditions, this reprents a signific
好听的童话故事>改编英语
ant problem for volatile element analysis in apatite. Although the effect is thought to be an intrinsic crystallographic respon to electron-beam exposure, the mechanisms and caus
我的小房间>干杯用英语怎么说
of the count rate variability remain unclear. We tackle this by examining directly the effects of electron-beam exposure on apatite, by performing condary ion mass spectrometry (SIMS) depth profiles of points previously subject to electron-beam irradiation. During irradiation of fluorapatite, oriented with the c-axis parallel to the electron beam,
运动会简讯
内容由中国教育图书进出口有限公司引进海德里希遇刺事件
>上海旅游景点推荐
