RING OSCILLATOR TEST CIRCUIT

更新时间:2023-08-03 15:40:35 阅读: 评论:0

专利名称:RING OSCILLATOR TEST CIRCUIT 发明人:BERNSTEIN, Joph B.
申请号:EP16725246.9
申请日:20160505
公开号:EP3292420A2
怎么煮荷包蛋公开日:巢蕨
20180314
专利内容由知识产权出版社提供王制
弟子规谨摘要:A ring oscillator test circuit, includes an odd number of stages, where each stage includes a load and drive transistor connected in ries at a common node. The common node of each stage is electrically connected to the drive transistor gate of the following stage, and the common node of the last stage is connected to the drive transistor gate of the first stage. A first voltage input connects to the drains of all the load transistors. A cond voltage input connects to the gates of all of the load transistors. A reference voltage input connects to the sources of all of the drive transistors. At least one of the common nodes connects to a test output.
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申请人:Ariel-University Rearch and Development Company Ltd.
酸白菜的腌制方法地址:Kiryat HaMada P.O. Box 3 4070000 Ariel IL
国籍:IL
维多利亚港湾代理机构:Patentanwälte Bauer Vorberg Kayr
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