Bump-on-Trace Structures with Incread Current En

更新时间:2023-08-01 04:12:07 阅读: 评论:0

专利名称:Bump-on-Trace Structures with Incread
Current Entrance Areas
发明人:Fu-Tsai Hou,Liang-Chen Lin保护眼睛的标语
申请号:US13172470
脊柱炎是怎么回事
申请日:20110629电场力做功
公开号:US20130001769A1
公开日:
20130103
专利内容由知识产权出版社提供
东京食尸鬼壁纸>讲规矩专利附图:
斯拉达
摘要:A device includes a package component, and a metal trace on a surface of the package component. A first and a cond dielectric mask cover a top surface and sidewalls of the metal trace, wherein a landing portion of the metal trace is located
between the first and the cond dielectric masks. The landing portion includes a first portion having a first width, and a cond portion connected to an end of the first portion. The cond portion has a cond width greater than the first width, wherein the first and the cond widths are measured in a direction perpendicular to a lengthwi direction of the metal trace.
申请人:Fu-Tsai Hou,Liang-Chen Lin
雪莉real地址:Hsin-Chu TW,Hsin-Chu TW
国籍:TW,TW
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