专利名称：Ur defined scaled mass defect plot with
filtering and labeling
远古动物发明人：Jonathan David Byer,Kevin Matthew Siek
申请号：US16081676
此刻心情
申请日：20170305
公开号：US11328916B2
生态园
公开日：
廉洁黑板报
20220510
24趣吧
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摘要：A method of determining mass defect plots with ur-defined mass scaling,filtering, and labeling in a mass spectrometer is described. An implementation of the method compris, (i) generating a mass defect plot from the data, (ii) filtering all ions in
the mass defect plot that do not have an associated isotopologue ion, (iii) lecting an unidentified ion, (iv) determining an isotope pattern of the unidentified ion, (v) identifying one or more elements indicated by the isotope pattern for the unidentified ion; (vi) arching formulas containing one or more elements indicated by the isotope pattern for the unidentified ion, (vii) determining a chemical formula of the identified ion, and (viii) displaying the chemical formulas for the unidentified ion on a screen.
申请人：LECO Corporation
地址：St. Joph MI US
活塞航空发动机
国籍：US
代理机构：Honigman LLP
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