Reduction of ZQ calibration time

更新时间:2023-07-27 18:30:10 阅读: 评论:0

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专利名称:Reduction of ZQ calibration time
廉吏发明人:Yasuo Satoh,Yuan He
申请号:US16700250
申请日:20191202
公开号:US10891989B2
公开日:
一剪梅原唱是谁
20210112
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摘要:A memory system includes an external calibration device that has a
predetermined impedance and a first memory device with a first pad for lective
connection to the external calibration device. The first memory device also includes an internal calibration device having an impedance that is programmable and a cond pad鱼翅的做法
connected to the internal calibration device. The system further includes a cond memory device having a third pad for lective connection to the cond pad of the first memory device. A processing device is operatively coupled to the first memory device and the cond memory device. The processing device programs the impedance of the internal calibration device of the first memory device bad on the external calibration device, and programs an impedance of a termination component in the cond memory device bad on the impedance of the internal calibration device of the first memory device.
申请人:Micron Technology, Inc.
地址:Boi ID US
国籍:US
五年级画画代理机构:Perkins Coie LLP
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