Determination of UTW kXSi factors for ven elements from oxygen to iron 期刊名称： Journal of Microscopy
秦岭水泥作者： G. Cliff,D. M. Maher,D. C. Joy觅食造句
年份： 1984年
期号： 第2期固态硬盘的好处
一个火一个同餐饮微信推广方案关键词： EDX calibration;ratio technique;kXSi factors;UTW Si(Li) X‐ray
家常韭菜盒子detectors;experimental determination;X‐ray microanalysis;thin foils
摘要：This study reports k factors for an ultra-thin window (UTW) Si(Li) energy dispersive (ED) X-ray detector which extends the limit for X-ray microanalysis in the analytical electron microscope (AEM) to elements below Na in the periodic table. The oxygen k factors reported for the UTW ED detector suggest that quantitative thin specimen X-ray analysis can be extended to oxygen.
空中的梦想家与谁同坐轩内容由中国教育图书进出口有限公司引进
