CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING

更新时间:2023-07-09 06:32:18 阅读: 评论:0

飞机座舱专利名称:CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING
发明人:ROESSL, Ewald,MARTENS, Gerhard
申请号:EP2014/063679
关于友情的谚语申请日:20140627
g31主板公开号:WO2014/207193A1
公开日:
20141231
专利内容由知识产权出版社提供清蛋糕
别担心英语
专利附图:牛肉菜谱
摘要:The prent invention relates to calibration in X-ray pha contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating (10) for a slit-scanning X-ray pha contrast imaging arrangement is provided that
梅表姐compris a first plurality of filter gments (11) comprising a filter material (12) and a cond plurality of opening gments (13). The filter gments and the opening gments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit-scanning system of a pha contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre-collimator pattern (61).
申请人:KONINKLIJKE PHILIPS N.V.
地址:High Tech Campus 5 NL-5656 AE Eindhoven NL
国籍:NL
一年级生字代理人:PASTINK, Hendrik Albert et al.
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