专利名称：TEG TEST KEY OF ARRAY SUBSTRATE AND
DISPLAY PANEL
发明人：Gang TAN
申请号：US16765430
外国名字大全申请日：20200421
公开号：US20220115279A1
公开日：
20220414
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摘要：A test element group (TEG) test key of an array substrate and a display panel thereof are provided. The TEG test key of the array substrate includes a glass substrate,a multi-buffer layer, an active layer, a gate insulating layer, a gate electrode layer, an
interlayer insulating layer, a source and drain electrode layer, and an organic planarization layer stacked in quence. The TEG test key of the array substrate is defined with two test zones and a connecting zone, and each test zone is provided with a groove exposing the gate electrode layer. The gate electrode layer in the test zones is electrically connected to the source and drain electrode layer in the connecting zone.四字名字男孩
申请人：WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
地址：Wuhan, Hubei CN
钓鱼调漂技巧国籍：CN
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