专利名称：Circuit and method for monolithic stacked
integrated circuit testing
发明人：Sandeep Kumar Goel
申请号：US14030684组网方式
申请日：20130918苹果手机怎么备份所有数据
公开号：US09599670B2
公开日：
20170321
专利内容由知识产权出版社提供
专利附图：动漫男生
摘要：A monolithic stacked integrated circuit (IC) is provided with a known-good-layer (KGL) path delay test circuit and at least a portion of a critical path in one of its layers.The test circuit includes a plurality of inputs, outputs, a flip-flop coupled to the at least a
竞相开放portion of the critical path and a multiplexer coupled to the flip-flop and to a cond layer of the IC. The test circuit further includes a control element such that path delay testing of the IC may be conducted on a layer-by-layer basis.
申请人：Taiwan Semiconductor Manufacturing Company, Ltd.
张爱玲与胡兰成
心理游戏地址：Hsin-Chu TW
国籍：TW
代理机构：Haynes and Boone, LLP
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