AFM-microRaman and nanoRaman TM
Introduction
The u of Raman microscopy has become an
important tool for the analysis of materials on the
micron scale. The unique confocal and spatial
resolution of the LabRAM ries has enabled optical
far field resolution to be pushed to its limits with
often sub-micron resolution achievable.
The next step to material analysis on a smaller
scale has been the combination of Raman
spectroscopic analysis with near field optics and an
Atomic force microscope (AFM). The hybrid
Raman/AFM combination enables nanometric
topographical information to be coupled to chemical
婆罗门(spectroscopic) information. The unique designs
developed by HORIBA Jobin Yvon enable in-situ
Raman measurements to be made upon various
different AFM units, and for the exploration of new
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and evolving techniques such as nanoRaman
spectroscopy bad on the TERS (tip enhanced
Raman spectroscopy) effect.
AFM image of nano-structures on a SiN sample
HORIBA Jobin Yvon offers both off-axis and on-axis
AFM/Raman coupling to better match your sample
and analysis requirements.
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Off-axis and inverted on-axis configurations for
AFM/Raman coupling showing the lar (blue) and
Raman (pink) optical path
The LabRAM-Nano Series is bad on the proven
LabRAM HR system providing unsurpasd
performance for classical Raman analysis. With the
AFM coupling option, it becomes the platform of
choice for AFM/Raman experiments. The off-axis
geometry offers large sample handling capabilities
and is ideally suited for the analysis of
miconductor materials, wafers and more generally
opaque samples.
For biological and life science applications, the
LabRAM-Nano operates in inverted on-axis
configuration with a confocal inverted Raman
microscope on top of which the AFM unit is directly
mounted. This system is ideally suited for the study
of transparent biological samples such as single
cells, tissue samples and bio-polymers.
In both systems, AFM and SNOM fluorescence
measurements can be combined with Raman
analysis to provide a more complete
characterisation of sample chemistry and
morphology on the same area. Several AFM
systems from leading AFM manufacturers can be
adapted on the two instruments. Plea contact
us to find out which one is best for you!
AFM- microRaman dual analysis
The amless integration of hardware and software of both systems onto the same platform enables fast and ur-friendly operation of both systems at the same time. Furthermore, the AFM/Raman coupling does not compromi the individual capabilities of either system and the imaging modes of the AFM remain available (EFM, MFM, Tapping Mode, etc.)
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The operator has direct access to both the nanometric topography of a sample given by the AFM, and the chemical information from the micro-Raman measurement. An AFM image can be
recorded as an initial survey map, in which regions of interest can be defined for further Raman analysis, using the same software.
An example of such analysis is illustrated below by an AFM image of Carbon Nanotubes (CNTs) giving information on the CNTs’ length, diameters and aggregation state. A more detailed AFM image is then obtained in which Raman analysis can be performed.
Carbon nanotubes AFM images with a gold-coated tip in contact mode. The diameter of the bundles of nanotubes is between 10 and 30 nm.
NanoRaman for TERS experiments
Surface Enhance Raman Scattering (SERS) has long been ud to enhance weak Raman signals by means of surface plasmon resonance using nanoparticle colloids or rough metallic substrates, allowing to detect chemical species at ppm levels.
The TERS effect is bad on the same principle, but us a metal-coated AFM tip (instead of nanoparticles) as an antenna that enhances the Raman signal coming from the sample area which is in contact (near-field). Although not yet fully understood, the TERS effect has attracted a lot of interest, as it holds the promi of producing chemical images with nanometric resolution.梁洛施面相
The LabRAM-Nano offers an ideal platform,
combining state-of-the-art AFMs with our Raman experti to perform exploratory TERS experiments with confidence.
Raman signal TERS enhancement on a Silicon sample with far field suppression thanks to adequate polarization configuration. Red : Far field + Near Field (tip in contact)– Blue : Far field only (tip withdrawn)
Technical specifications
Flexure guided scanner is ud to maintain zero background curvature below 2 nm out-of-plane
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For non-TERS measurements, classical Raman measurements can be made on the same spot as AFM images by translating the sample with a high-accuracy positioning stage from the AFM tup to the Raman tup (and vice et versa). The AFM map can be ud to define a region of interest for the Raman analysis
using a common software.
LabRAM-Nano coupled with Veeco’s Dimension 3100 AFM
The on-axis coupling configuration enables both AFM-microRaman dual analysis and TERS measurements
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on transparent and biological samples. The AFM is directly coupled onto the inverted microscope and directly
interfaced to the LabRAM HR microprobe. It can also be taken off the optical microscope to obtain AFM
images in a different location. Seamless software integration is realized to provide a common platform to both
systems for both AFM and Raman analysis of the same area and TERS investigation.
Bioscope II from Veeco
小鱼怎么画LabRAM-Nano coupled with Park Systems
(formerly PSIA) XE-120
Off-axis coupling for AFM-microRaman and nanoRaman (TERS)
For both dual AFM-microRaman dual analysis and TERS measurements, the off-axis coupling is ideally suited for opaque and large samples. For opaque samples, the inverted on-axis coupling is not possible as the sample will not transmit the lar beam. This can be solved by tting the microscope objective at some angle to avoid “shadowing” effects from the AFM cantilever. Here also, amless software integration is realized to provide a common platform to both systems. The AFM can be controlled by the Raman software (LabSpec), and mapping areas can be defined on AFM images for further Raman analysis.
France : HORIBA Jobin Yvon S.A.S., 231 rue de Lille, 59650 Villeneuve d’Ascq. Tel : +33 (0)3 20 59 18 00, Fax : +33 (0)3 20 59 18 08. Email : raman@jobinyvon.fr www.jobinyvon.fr
USA : HORIBA Jobin Yvon Inc., 3880 Park Avenue, Edison, NJ 08820-3012. Tel : +1-732-494-8660, Fax : +1-732-549-2571. Email :
Japan : HORIBA Ltd., JY Optical Sales Dept., 1-7-8 Higashi-kanda, Chiyoda-ku, Tokyo 101-0031. Tel: +81 (0)3 3861 8231, Fax: +81 (0)3 3861 8259. Email: LabRAM-Nano coupled with Park Systems (formerly PSIA) XE-100
