专利名称：EMISSIVITY METER
发明人：ARAKAWA YOSHIAKI,FUKUNAGA HIROSHI 申请号：JP12369282
申请日：19820715
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公开号：JPS5913927A石钟乳
公开日：
19840124
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精卫词摘要：PURPOSE:To obtain emissivity without influences of temperature on a surface of a material to be measured and a surface of an emissivity plate of an emissivity meter, by providing three emissivity plates or more having different emissivities on the same plane and obtaining the density of a flowing heat current. CONSTITUTION:Three emissivity plates 2a-2c having known emissivities and different values respectively are provided cloly to each other on the same plane, and heat current meters 5a-5c are provided respectively at the rever sides. The emissivity of a material surface 1 to be measured is denoted by epsilonx, the respective emissivities of the plates 2a-2c as epsilon1-epsilon3 and the heat current densities passing respectively through the plates 2a-2c as psi1-
居家健身动作psi3,respectively. It is found from an equation that DELTApsi13/DELTApsi23 is a function of epsilonx, and if outputs of psi1-psi3 of the meters 5a-5c are found, the emissivity epsilonx of the surface 1 can be obtained independently of the surface temp. Ts of the material to be measured and the surface temp. Tp of the emissivity plate.
申请人：SHOWA DENKO KK
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