laParticle size analysis-Lar diffraction methods (ISO-13320-1)
Introduction
Lar diffraction methods are nowadays widely ud for particle sizing in many different applications. The success of the technique is bad on the tact that it can be applied to various kinds of particulate systems, is fast and can be automated and that a variety of commercial instruments is available. Nevertheless, the proper u of the instrument and the interpretation of the results require the necessary caution.
五月天自拍Therefore, there is a need for establishing an international standard for particle size analysis by lar diffraction methods. Its purpo is to provide a methodology for adequate quality control in particle size analysis.
Historically, the lar diffraction technique started by taking only scattering at small angles into consideration and, thus, has been known by the following names:
-fraunhofer diffraction;
-(near-) forward light scattering;
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-low-angle lar light scattering (LALLS).
However, the technique has been broadened to include light scattering in a wider angular range and application of the Mie theory in addition to approximating theories such as Fraunhofer and anomalous diffraction.
The lar diffraction technique is bad on the phenomenon that particles scatter light in all directions with an intensity pattern that is dependent on particle size. All prent instruments assume a spherical shape for the particle. Figure 1 illustrates the characteristics of single particle scattering patterns: alternation of high and low intensities, with patterns that extend for smaller particles to wider angles than for larger particles[2-7,10,15 in the bibliography].
Within certain limits the scattering pattern of an enmble of particles is identical to the sum of the individual scattering patterns of all particles prent. By using an optical model
to compute scattering for unit volumes of particles in lected size class and a mathematical deconvolution procedure, a volumetric particle size distribution is calculated, the scattering pattern of which fits best with the measured pattern (e also annex A).
逗留的近义词 A typical diffraction instrument consists of a light beam (usually a lar), a particulate dispersing device, a detector for measuring the scattering pattern and a computer for both control of the instrument and calculation of the particle size distribution. Note that the lar diffraction technique cannot distinguish between scattering by single particles and scattering by clusters of primary particles forming an agglomerate or an aggregate. Usually, the resulting particle size for agglomerates is related to the cluster size, but sometimes the size of the primary particles is reflected in the particle size distribution as well. As most particulate samples contain agglomerates or aggregates and one is generally interested in the size distribution of the primary particles, the clusters are usually disperd into primary particles before measurement.
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Historically, instruments only ud scattering angles smaller than 14°,which limited the application to a lower size of about 1μm. The reason for this limitation is that smaller particles show most of their distinctive scattering at larger angles (e also annex Z).Many recent instruments allow measurement at larger scattering angles, some up to about 150°鼻炎怎么治好,for example through application of a converging beam, more or larger lens, a cond lar beam or more detectors. Thus smaller particles down to about 0.1μm can be sized. Some instruments incorporate additional information from scattering intensities and intensity differences at various wavelengths and polarization planes in order to improve the characterization of particle sizes in the submicrometre range.
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Particle size analysis – Lar diffraction methods-
Part 1:
General principles
1 scope
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This part of ISO 13320 provides guidance on the measurement of size distributions of particles in any two-pha system, for example powders, sprays, aerosols, suspensions, emulsions and gas bubbles in liquids, through analysis of their angular light scattering patterns. It does not address the specific requirements of particle size measurement of specific products. This part of ISO13320 is applicable to particle sizes ranging from approximately 0.1μm to 3μm.
For non-spherical particles, an equivalent-sphere size distribution is obtained becau the technique us the assumption of spherical particles in its optical model. The resulting particle size distribution may be different from tho obtained by methods bad on other physical principles (e.g. Sedimentation, sieving).
