专利名称：Method for direct access test of embedded cells and customization logic
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发明人：Tushar R. Gheewala
申请号：US08/822383
申请日：19970320
公开号：US05799021A
公开日：
蒜蓉粉丝基围虾
把脉的原理19980825
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摘要：Methods and related structures for both operating and testing an integrated circuit constructed of combinations of customization logic and embedded cells. Functional modes include an operational mode and a test mode with two submodes. Test terminals of embedded cells, as well as test points in customization logic, are both accesd via a multiplexing scheme using test points of x-y (row and column) wiring traces of a grid- bad "cross-check" test structure for both logic testing and embedded cell testing. Common conductors or traces can be ud to operate the embedded cells and to control the made and test the embedded cells and customization logic. The x and y lines can be operated as signal lines, as probe lines, as n lines and as control lines, as needed, using multiplexing according to the invention. In addition, the x and y lines can be ud, in connection with analog multiplexers and switches, to probe, stimulate and n embedded analog signal circuits, subsystems and conditions of an embedded cell. In a ca where multiple probe lines are active, test points are held in a high impedance state by placing the clock of latches or flip flops at the interctions of the n lines and the probe lines in a suspended state and applying only half the switching voltage to the line operative as the n line. Such latches also permit testing in the prence of
秋天养生
降温了
asynchronous signals.
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申请人：DUET TECHNOLOGIES, INC.
代理机构：Townnd and Townnd and Crew LLP 代理人：Kenneth R. Allen
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