专利名称：SEMICONDUCTOR APPARATUS AND TEST
METHOD THEREOF
发明人：Min Chang KIM
申请号：US14742956
申请日：20150618
公开号：US20160300625A1
公开日：
猴子的英语怎么读20161013
葛鲁嘉专利内容由知识产权出版社提供
王恩琦专利附图：武汉大学樱花节
摘要：A miconductor apparatus may include a first data processing block
electrically coupled between a first input/output pad array and a first memory array. The miconductor apparatus may include a cond data processing block electrically
coupled between a cond input/output pad array and a cond memory array. The first test verification data and cond test verification data may be generated by causing data to be respectively outputted from the first memory array and the cond memory array to pass through the first data processing block and the cond data processing block, according to a read command and a plurality of control signals. The first test verification data and the cond test verification data may be respectively written again in the first memory array and the cond memory array. A result of comparing the first test verification data and the cond test verification data may be outputted through the first input/output pad array.
申请人：SK hynix Inc.
数学网课
地址：Icheon-si Gyeonggi-do KR
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国籍：KR
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