挑三拣四专利名称：SINGLE-LUMINOUS-FLUX MEASURING INSTRUMENT
发明人：IIDA ATSUHIRO
申请号：JP19742089
申请日：19890728
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公开号：JPH0359445A
左岸右岸公开日：说明文的顺序
19910314
专利内容由知识产权出版社提供
互联网模式摘要：PURPOSE:To reduce the cost of the device by switching the thickness of a sample between two kinds of thick and thin thickness at the position where single measure ment luminous flux is transmitted through a sample and providing a light measurement part which outputs the difference in absorbance between a thick and a thin sample layer. CONSTITUTION:Light from a light source 1 is projected from a spectroscope 2 as luminous flux L, which is made incident on the light measurement part 4 through a sample chamber 3. Here, a sample cell C is placed on the optical path of the measure ment luminous flux and the center of rotation of a transparent body disk D supported rotatably on a horizontal shaft in the cell C is parallel to the measurement luminous flux and off the measurement luminous flux; and the measurement luminous flux L pass through the thin part d2 from the thick part d1 by the rotation of the disk D and the sample layer varies in thickness accordingly. A conductor ring Dc is fitted onto the outer periphery of the disk D and rotated with a moving magnetic field M which is produced outside below the bottom surface of the cell C. Further, the disk D is provided with an opaque part Di to make the luminous flux continuous, and the light measurement output when the parts of thickness d1 and d2 and the part D; of the disk D are in the感冒咳嗽药>霍元甲简介
measurement optical path is sampled to perform arithmetic with a specific expression.
申请人：SHIMADZU CORP
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