专利名称：Double bit error correction using single bit error correction, double bit error detection
游来游去的鱼儿logic and syndrome bit memory
八一建军节的由来临沂光耀实验学校发明人：James H. Scheuneman,John R. Trost
申请号：US05/827540
申请日：19770825怎么解封微信
公开号：US04139148A
公开日：
19790213
专利内容由知识产权出版社提供
黯然的意思
摘要：A method of and an apparatus for obtaining double bit error correction capabilities in a large scale integrated (LSI) miconductor memory system using only single bit error correction, double bit error detection (SEC, DED) logic are disclod. The method is bad upon the statistical assumption that in a large scale integrated miconductor memory, substantially all errors in the data bits that make up a data word are initially a single bit error and that increasing multiple, i.e., double, triple, etc., bit errors occur in a direct increasing ratio of the u or lection of the data word. In the prent invention, all data words are priorly tested to be error free. Subquent detection of single bit errors results in the correction of the single bit error and the storage of the single bit error correcting syndrome bits in a syndrome bit memory. Subquent detection of double bit errors, in the previously single bit error detected and corrected data words, results in the correction, by single bit error correcting syndrome bits, of the previously detected single bit error. This single bit error corrected data word is then again single bit error corrected, i.e., two successive single bit error corrections, to provide a twice corrected double bit error data word.
王勃代表作>蚊子怕什么申请人：SPERRY RAND CORPORATION
六年级下册语文书人教版
代理人：Kenneth T. Grace,William E. Cleaver,Marshall M. Truex 更多信息请下载全文后查看
