Chroma 33XX VLSI Test System
By Chris Semiconductor Test Equipment BU Chroma ATE, Inc. 2011/5/26
突然分娩1
Content
中华护理Chroma’s Specification Benchmark Comparison Chroma’s Benefits Summary
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半導體產品分布圖 半導體產品分布圖
Module Tester
em t ys s st e t
S CI
PXI Moudle Tester
SD Car d
3280 SD card Test DUT :120天使三人行
爱国句子3270+3360P CIS FT Test DUT :16
D LC
st e rT e v i Dr
tem s Sy
3520 for STN/CSTN/Gate/Source/ OLED Driver ICs 36010/36020 Test Channel : 64 DUT :32 3650IS CIS CP Test DUT :16 3500 for STN/CSTN/Gate/Logic
ystem S t s e T LSI SOC / V
3360 Test Channel : 608 DUT :32
3360P Test Channel : 256 DUT :32
3360D Test Channel : 64 DUT :8
3650 Test Channel : 512 DUT :32
3650CX Test Channel : 256 DUT :32
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3360/3360P/3360D Introduction
Target IC: High Multi-Site for Low Pin Count Device
MCU + Peripheral / MCU + ADDA Consumer IC (Smart Card / OTP / SD Card + Card Reader PC IO/ MP3 / Flash controller /Embedded Flash) LED Driver IC / Power Management IC
3360
Mainframe :960mmX760mmX1750mm Head : 700mmX700mmX430mm
3360P
Test Head 470mmX640mmX639mm补阴的食物
3360D Test Head: W330*D560*H390
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3360/3360P/3360D Specification
Standard\ Specification
Test Rate Pin Channels ( Including TMU) Pattern Memory Parallel Testing Capability EPA Resource Per Pin Architecture DPS PMU PPMU Programmable Load Windows Environment Programming Language Test Option AD/DA Converter Test Option Mix-Signal Option VI Board SCAN Option ALPG Memory Test Option 8Ch (4AWG / 4DGT ( 16 Bits)) NI 4461 (24 bit 200K) ; NI 5542 (AWG16 bit 200M);NI5922 (DIG22bit 1M) Max V : 100V , Max I : 6A 512M Per board 16X, 16Y, 16D Per-Board 50MHz 608 Pins (19 I/O slot) 8M/16M 32 DUT 625ps Yes 8ch (+/-10V 2A) 32ch (+/-48V 100mA) Per Pin Per Pin Windows XP C\C++斜挎包男
3360
电脑如何下载软件3360P
50MHz 256 Pins (8 I/O slot) 8M/16M 32 DUT 625ps Yes 8ch (+/-10V 2A) 16ch (+/- 48V 100mA) Per Pin Per Pin Windows XP C\C++
3360D
50MHz 64 Pins (2 I/O slot) 8M/16M 8 DUT 625ps Yes PMUVI: 8ch (+/-16V 400mA) 8ch (+/-16V 100mA) Per Pin Per Pin Windows XP C\C++
每個 I/O Slot 皆可插入UVI / PREF / ADDA / Mix-Signal / LCD Board，以擴充 IC test type.
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