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datasheet Production Systems
2DATA SHEET
Features
• Broad t of production alternatives for stand-alone and integrated operation
• Execution of all JTAG Technologies boundary-scan applications developed on ProVision or ‘Classic’ platforms
• Player for SVF , JAM and STAPL files from third-party sources
• Results collection for analysis at repair station • Built-in report generator and ticket printing facility
• Password-protected entry levels
• Support for all popular National Instruments’ plat -forms
• Support for Microsoft Visual Basic, C, C++, and
• Fault analysis to pin-level via BSD (Boundary- Scan Diagnostics) and JTAG Visualizer
• Open architecture - links can be provided to virtu -ally all third-party ATE systems.
Overview of boundary-scan
胃不和则卧不安The JTAG Technologies product line is focud on testing printed circuit boards (PCBs) and systems and includes on-board device programming features, all utilizing powerful JTAG boundary-scan technology. Boundary-scan compliance to IEEE 1149.1 and
related standards overcomes the physical access limi -tations associated with advanced integrated
circuit packaging such as ball-grid arrays (BGAs).In addition, boundary-scan can simplify test fixtures and product handling when compared to conventio -nal test and programming methods such as in-circuit (bed-of-nails) testing and off-line device program -ming. JTAG Technologies tools are ideal for proto -type hardware debugging and device programming, production testing and in-system programming (ISP) and field rvice.
Application development and validation
Boundary-scan applications are typically prepared and validated by test engineering teams or individu -als using the highly automated JTAG Technologies ProVision development tool (Figure 1) or the prior generation known as JTAG Classic. Both
environments provide great flexibility in the genera -tion of test applications for scan path infrastructure testing, interconnect testing, cluster and memory block testing, functional logic testing plus program -ming of devices such as flash memories, rial PROMs, CPLDs and embedded flash within micro-
controllers. DFT (Design-For-Test) fault coverage真象
Figure 1, JTAG Technologies ProVision
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analysis is an important capability of the development tools guiding designers and test engineers in achieving fault coverage goals. Analysis results can be viewed graphically using JTAG Visualizer in both schematic and layout domains. Refer to companion brochures on ProVision and Visualizer for
more de-tailed information.
All test and ISP applications can be executed and validated in the development environment prior to delivery to the production facility. Test quences can also be created for production testing and / or programming within the ProVision development tool. Complete production test archives can then be exported from ProVision including the previously prepared quence.
Test results are prented to the designer in a
truth-table format that highlights all differences from the expected respon. An optional diagnostics tool analyzes the test results and indicates the location
of the fault or faults; JTAG Visualizer prents the fault identification right on the schematic and layout drawings.
Choices for production
A wide variety of execution (run-time) software is available to meet different requirements. Often, a stand-alone boundary-scan solution will be preferred for prototype debugging and for field rvice as well as in some production scenarios.
The choice of a stand-alone boundary-scan strategy allows the manufacturer to parate the task of struc-tural testing (and associated fault diagnostics) from subquent functional tests. Moreover, a stand-alone system might be ud for repetitive and possibly time-consuming programming of flash memories and/or PLDs to ‘unload’ a more expensive in-circuit tester.
In other cas, rather than establishing a stand-alone station, it may be desirable to combine boundary-scan with an existing test system such as an
in-circuit (bed-of-nails) tester, flying probe system, or functional test system. Among the benefits of combi-ning boundary-scan with other test methods are:
- Achieving more comprehensive test coverage, taking advantage of the particular strengths of the various techniques
- Reduced product handling by combining test steps into one station
- Reduced operator training, by including the boundary-scan control and results collection within the test plan of the existing test system - Reduced test fixture complexity and minimized duplication/ overlap of test boundaries.
A wide variety of integration choices is available, grouped in three classifications:
- P roduction Integration Packages (PIP), typically
ud by functional test system builders
- S ymphony systems, consisting of all of the
software and hardware modules needed to
upgrade an existing ICT or flying probe system
to full JTAG Technologies boundary-scan
capability
- O EM systems, devid by and available from
third-party tester vendors, which incorporate
JTAG Technologies software and hardware
modules
Stand-Alone Boundary-scan Station
Stand-alone boundary-scan operations may be performed on a dedicated test system running JTAG Technologies Production Stand-Alone (PSA) software featuring AEX Manager -a graphical JTAG application executive program.
查看历史PSA supports all of the boundary-scan hardware controllers from JTAG Technologies and handles up to
four targets simultaneously depending on the control-
ler type. Multiple boundary-scan controllers can be
ud from a single licence for even greater throughput. JTAG Technologies PSA package provides the runtime control and management functions through the embedded AEX Manager. Features include If-
Then-El conditional branching, test flow control,
test report generation and results logging recorded
by rial number.
A variant of the AEX Manager is also embedded
within JTAG ProVision, the application generation
tools suite. Thus ProVision software not only allows generation, compilation and execution of individual applications, but also the generation of application
‘scripts’ or ‘quences’.
Complete, validated boundary-scan application
scripts can then be confidently exported to
production facilities by designers or test engineering professionals.
Alternatively, a single instance of JTAG ProVision
can be ud effectively for both development and production, providing a cost-effective solution in
caes where both activities are to be performed at the
same station.
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The production stand-alone software package (PSA) and the alternate ProVision platform implementation, include runtime software (execution modules) and AEX Manager with its graphical ur interface. All production operations required for testing, flash programming, and CPLD programming using IEEE 1532, JEDEC, SVF or JAM / STAPL formats can be executed.
To support different types of ur activities in the pro -duction environment, AEX contains three password- protected levels:
• Developer Full access to all features allowing the test engineer to create and validate quences • Engineer Ud by the production supervisor to view the progress of a quence execution or to change operational ttings
Figure 2, Stand-alone boundary-scan station
Figure 4, AEX Manager Sequence Screen with a BSD report
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• Operator Ud by the operator to initiate
execution of the production
quence, perform tasks defined in
the quence, and obrve the results The results of a boundary-scan application quence are prented in three levels of detail:
• Pass/fail display, suitable if the technician is not expected to troubleshoot the board, but rather to nd defects to the repair department.
• Truth-table format, as shown in Figure 3, in which differences between actual and expected respon are highlighted, allowing the ur to quickly focus on problem resolution. The ur can filter the results to e only the failing vectors
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and/or nets.
• Full diagnostic output, provided by the boundary- scan diagnostic (BSD) software m odule, which pin-points the fault caus and corrective action. Figure 4 is an example of the AEX manager with the corresponding BSD output screen.
社会养老保险条例During quence execution, results data are stored in a predefined location associated with the particular target board for subquent u in repair. In addition to the built-in data storage and logging capabilities of the stand-alone production package, the AEX Mana-ger contains a default interface to the widely ud Teradyne TRACS databa management system. Production Integration Packages
JTAG Technologies production integration packages (PIPs) support execution of boundary-scan applicati-ons in a range of software environments such as tho from National Instruments and Microsoft. The PIPs are often employed to run boundary-scan testing and programming within a functional test system. Supported platforms are:
- PIP / TS for National Instruments TestStand
- PIP / LV for National Instruments LabVIEW
- PIP / LW for National Instruments LabWindows
- PIP / ATE for Geotest ATEasy
- PIP / VB for Microsoft VisualBasic
- PIP / DLL for Microsoft C and C++
- PIP / Net for Microsoft
- PIP / EXE for general integration via system calls Each PIP with the exception of PIP / EXE includes
an API for the associated software environment and is supported by a comprehensive manual including examples for each library within the PIP package. Language-bad PIPs (PIP / DLL, PIP / VB, PIP / LW
and PIP / Net) are ud by experienced developers to
add boundary-scan functions into their test executive programs. PIP / TS and PIP / LV offer high-level exe-
cution via custom step-types and virtual instruments, respectively; e Figure 5 for a LabVIEW example.
PIP/EXE utilizes an executive program or a batch file
to launch DOS-like command lines with appropriate command line options. The reference manual inclu-
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ded with this system fully documents the command
line operations.
JTAG Structural Tester Integration
JTAG Technologies’ structural test integration packa-
ges add powerful boundary-scan features to existing
in-circuit and flying probe structural test systems,
often at lower cost than native vendor options. Fur-thermore, off-line test generation and debug reduce
excel甘特图制作教程the load on costly ATE systems and allows swift implementation of boundary-scan on many of today’s
ATE platforms.
All boundary-scan integration options require that a
JTAG-compatible (IEEE Std 1149.x) hardware
controller be implemented within the system.
Solutions that employ a JTAG Technologies controller
are ideal for high-speed in-system flash programming
as well as testing. Solutions which u a controller
native to the in-circuit tester or flying probe system
are suitable for boundary-scan testing but not for
flash programming. Symphony systems from JTAG Technologies provide complete integration solutions
for a range of popular in-circuit testers and flying
probe systems:
- Symphony 3070 for the Agilent 3070 in-circuit
test system Integration with the Agilent 3070
us the JTAG Technologies JT 37x7/ APC
controller incorporating a full-function
Figure 5, Example test program using PIP for LabVIEW
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