专利名称：The joint
发明人：上野 哲司，平田 嘉裕，岡田 一範，川瀬 和典申请号：JP2005505411grow是什么意思
英语邀请函范文申请日：20040413tenniscourt>tippi
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公开号：JP4736803B2
公开日：
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20110727
专利内容由知识产权出版社提供
猫鼠游戏第四季摘要：As for purpo of this invention, the foreign material is difficult to come in contact in the probe which contacts the electrode pad of the miconductor device, the form change prent is difficult, it can keep satisfactory electric contact in long term, high quality there are times when the probe is offered. The contact ction where as for the probe of this invention, with the probe which contacts the electrode pad of measuring object ones, as for the probe, it is formed just with the thing, posss with the support ction where the connected terminal and posss acute form the contact ction and the contact ction which are connected to the baplate are supported, extends from the support ction point, as the support ction had the cross ction which at least shares 1 sides, is a feature in constituting.
申请人：住友電気工業株式会社
renyi>youbi地址：大阪府大阪市中央区北浜四丁目５番３３号
国籍：JP
代理人：▲吉▼川 俊雄
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