SEM原理

更新时间:2023-05-20 12:47:50 阅读: 评论:0

•Electron source -gun •Electron column
在线英语广播-lens
watchdog是什么意思-aperturesbopet
-deflection coils •Specimen chamber with detectors
NFMC Spring School on Electron Microscopy, April 2011
W-hairpin
E =105A/cm 2sr d s = 30-100 P m
LaB 6
E =106A/cm 2sr d s = 5-50 P m
Field emission -Cold -Thermal -Schottky
SEM: Electron Lens
Electromagnetic lens defects:
Spherical aberration: d s =1/2C s D 3Chromatic aberration: E/E 0)
1/f=1/p+1/q Magnification =M=q/p Demagnification=m=p/q
The working distance is defined as the distance between the lower pole piece of the objective lens and the plane at which the probe is focud.
Working distance
Pole piece
致辞英文detector
悉尼奥运会闭幕式
Sample at ideal working
distance for X-ray
microanalysis
gmv是什么意思
Sample at incorrect working distance for X-ray microanalysis
Effect of aperture size Effect of condenr lens strength
Effect of working distance
=(d
G
2+d
S
2+d
d
2+d
C涤荡
2)1/2 min
员工关系管理
= KC
s
1/4l3/4(i
p
/EO2+1)
principal读音
晚安的英文SEM: Interaction Volume
Penetration depth: 1-5 P

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