专利名称：Equal path, pha shifting, sample point interferometer for monitoring the
configuration of surfaces
发明人：Paul K. Manhart
申请号：US07/527509
申请日：19900523
好看美剧公开号：US05080490A
雅思写作公开日：
19920114
bookingacquireknowledge专利内容由知识产权出版社提供
摘要：A system for monitoring the configuration of a surface (e.g., a gmented parabolic surface) using orthogonally placed retroreflectors at ts of points A, B and C disperd throughout the surface with a stationary halfwave plate HWP in the front of the one retroreflector at a corner point C and a rotating halfwave plate RHWP over a source of linearly polarized coherent light, thereby causing the direction of linear polarization to continuously rotate through 360° and causing light returned by the retroreflector at point C to be continuously pha shifted through 360° relative to light returned by retroreflectors at points A and B. The returned light from each t of points A. B and C is focud onto a bed-of-nails (BON) pha grating diagonally oriented with respect to the orthogonal orientation of the incident beams from retroreflectors A, B and C, thereby causing overlap in the light from points A and C and from points B and C to produce interferometric signals AC and BC. Any change in pha of the interferometric signals AC and BC indicates both the magnitude and direction of any change in the position of the retroreflector at point C relative to retroreflectors at points A and B.
全国大学英语四六级考试(cet)官网
stay up申请人：THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR
模具设计学校>启程歌词
snailOF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION 代理人：Thomas H. Jones,John R. Manning
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