Circuit and method for monolithic stacked integrat

更新时间:2023-07-07 04:58:17 阅读: 评论:0

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mens专利名称:Circuit and method for monolithic stackeddot pitch
integrated circuit testing
perpetuum发明人:Sandeep Kumar Goel
申请号:US14030684
申请日:20130918
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宁缺毋滥是什么意思公开号:US09599670B2
公开日:
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20170321
专利内容由知识产权出版社提供
专利附图:
摘要:A monolithic stacked integrated circuit (IC) is provided with a known-good-layer (KGL) path delay test circuit and at least a portion of a critical path in one of its layers.The test circuit includes a plurality of inputs, outputs, a flip-flop coupled to the at least a
portion of the critical path and a multiplexer coupled to the flip-flop and to a cond layer of the IC. The test circuit further includes a control element such that path delay testing of the IC may be conducted on a layer-by-layer basis.
申请人:Taiwan Semiconductor Manufacturing Company, Ltd.
七下英语单词表地址:Hsin-Chu TW
succession国籍:TW
代理机构:Haynes and Boone, LLPshooting
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