专利名称:Ca for specimen analyzing kit, kit for
participate
specimen analyzing, specimen analysis
are you kidding meapparatus and control method of specimen
analysis apparatus
发明人:Bae, Byeong Woo,Lee, Sung Dong,Kang, Rae Ho,Shin, Ji Hun,Hong, Ju Pyo
申请号:EP13182195.1
visibility
easter day>anthony申请日:20130829
公开号:EP2703803A3
公开日:
neither是什么意思
phoebus20140507
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专利附图:adhoc
摘要:Provided is a specimen analysis apparatus. The specimen analysis apparatus includes an image photographing unit photographing an identification code dispod on a kit for specimen analyzing and a specimen reaction result reacting by injecting a specimen into the kit for specimen analyzing and a main body on which the image photographing unit is mounted. The image photographing unit photographs the identification code and the specimen reaction result with a time difference.
申请人:Infopia Co., Ltd.
地址:891 Hogye-dong Dongan-gu Anyang-si Gyeonggi-do 431-080 KR
国籍:KRfoot的复数
代理机构:Kleine, Hubertus
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