defect

专利名称：Defectscanandmanufacturetest

发明人：YuKou,LingqiZeng

申请号：US14054662

申请日：20131015

公开号：US08996954B2

公开日：20150331

专利内容由知识产权出版社提供

专利附图：

摘要：Amethodfordetectingadefectinaportionofastoragedeviceisdisclod.

Referencedataanddatareadfromtheportionarecomparedtodetermineanumberof

rratioiscomputed,whereintheerror

ratiocomprisaratioofthenumberoferrorbitstothenumberoferrorsymbols.A

embodiments,thereferencedataandthereaddataarecomparedtodetermineanerror

vector,whereinabitintheerrorvectorwithavalueoneindicatesabiterrorintheread

hofapluralityofwindowsoftheerrorvector,acorrespondingnumberof

tisdetectedbadonwhetheranyofthenumbersof

errorbitxceedsathreshold.

申请人：SKhynixmemorysolutionsinc.

地址：SanJoCAUS

国籍：US

代理机构：VanPelt,Yi&JamesLLP

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